MSD SEM and XRD Facility

• X-ray Diffraction Laboratory
• Scanning Electron Microscopy Laboratory
  • Hitachi Environmenal SEM (Bldg. 62-116)
  • ISI High Resolution Analytical SEM DS-130C (Bldg. 62-114)

X-ray Diffraction Laboratory

X-ray Diffraction Laboratory

Building 62-145

Staff: Dr. Eduardo Saiz, x6202

This lab is located in Bldg. 62-145 and has two Siemens D-500 diffractometers for determining the crystal structure and phase composition of polycrystalline materials. There is a thin film attachment that can be used with one of the diffractometers.

Training: All users are trained on the equipment

Safety: No safety hazards, Film badge is required.

Fee for use: FY06 recharge rate is $80/hr. (direct) to a valid LBNL account number

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Scanning Electron Microscopy Laboratory

Building 62-114 and 116

Staff: Dr. Eduardo Saiz, x6202

Hitachi Environmental SEM (Bldg. 62-116)
Field Emission Variable Pressure SEM
Model S-4300SE/N

The vacuum system has been designed with multi differential pumping which allows a wide range of vacuum control keeping the pressure difference of 10-11Pa between sample chamber and gun chamber. The use of a Schottky thermal FE source gives excellent resolution yet also provides sufficient beam current for EDX analysis. The flexibility of variable pressure operation means that difficult wet, oily and nonconductive specimens can be examined without sample preparation. The S-4300SE/N has extensive automated features, including autofocus, autostigmator, autobrightness and autocontrast. Images are acquired digitally and image processing and image management systems are incorporated in the instrument.

Specifications

• Reducing charging on the sample makes it possible to observe and analyze insulated materials or non-coated samples.
• Specimen size up to 160 mm.
• Secondary Electron Image Resolution: 1.5nm @ 30kV
• Quick and easy observation of samples which contains water or oil is possible without sample preparation. By using the Cold Stage (-20 – 10 dsegrees C), longer observation is possible.
• Variable Pressure Technology
  • Observation of wet, oily or dirty samples
  • No need for sample preparation such as drying or coating
  • Elimination of sample charging

ISI High Resolution Analytical SEM DS-130C (Bldg. 62-114)
Decommissioned 4/06

This SEM has lanthanum hexaboride (LaB6) electron cathode (filament). This source provides a high brightness electron gun; hence more electron current can be concentrated into a smaller beam spot. In this way, an effective improvement in resolution is obtained. The resolution at top stage is in the range of 25 angstroms. The bottom stage has the resolution of 50 angstroms. The microscope is also capable of examining objects at very low magnification (4x). This microscope is also used to produce selective-area channeling patterns, which yield information about crystal structure and orientation. This microscope has Energy Dispersive X-ray Spectrometer (EDS) attached to the top stage and Wavelength Dispersive Spectrometer (electron probe microanalyzer, EPMA) attached to the bottom stage. In the electron microprobe, the primary radiation of interest is the characteristic x-rays which are emitted as a result of the electron bombardment. The analysis of the characteristic x-radiation can yield both qualitative and quantitative compositional information from regions of a specimen as small as few micrometers in diameter. The EDS system offers a means of rapidly evaluating the elemental composition of specimens. In the windowless mode, EDS system is capable of analyzing all elements heavier than carbon (atomic number 6).

Fee for use: FY06 recharge rate is $78/hr. (direct) to a valid LBNL account number