PATENT ABSTRACT:

An integrated circuit which provides multi-channel detector readout from a detector array. The circuit receives multiple signals from the elements of a detector array and compares the sampled amplitudes of these signals against a noise-floor threshold and against one another. A digital signal is generated which corresponds to the location of the highest of these signal amplitudes which exceeds the noise floor threshold. The digital signal is received by a multiplexing circuit which outputs an analog signal corresponding the highest of the input signal amplitudes. In addition a digital control section provides for programmatic control of the multiplexer circuit, amplifier gain, amplifier reset, masking selection, and test circuit functionality on each input thereof.

STATUS:

• U.S. Patent #6,7373,627.
• Available for licensing

REFERENCE NUMBER: IB-1472

SEE THESE OTHER BERKELEY LAB TECHNOLOGIES IN THIS FIELD:

• Fast Scintillation Detectors Using Direct-Gap Semiconductors, IB-1833